ISSN 2380-4505
Vol. 2013, Issue HITEN, 2013January 01, 2013 EDT
High Temperature Characterization and Reliability Data of Key Semiconductor Technologies for Power and Control Devices
High Temperature Characterization and Reliability Data of Key Semiconductor Technologies for Power and Control Devices
Brian Wilkinson, Kent Walters, Paul Ellerman,
Wilkinson, Brian, Kent Walters, and Paul Ellerman. 2013. “High Temperature Characterization and Reliability Data of Key Semiconductor Technologies for Power and Control Devices.” IMAPSource Proceedings 2013 (HITEN): 88–95. https://doi.org/10.4071/HITEN-MP16.