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High Temperature Conference Papers
Vol. 2013, Issue HITEN, 2013January 01, 2013 EDT

High Temperature 256Kbit (32Kbit × 8) HTEEPROM Reliability Testing

Joe G. Guimont, Bruce W. Ohme,
High-temperature electronicsEEPROMReliabilitySOI CMOSNon-volatile Memory
https://doi.org/10.4071/HITEN-TA12
IMAPSource Conference Papers
Guimont, Joe G., and Bruce W. Ohme. 2013. “High Temperature 256Kbit (32Kbit × 8) HTEEPROM Reliability Testing.” IMAPSource Proceedings 2013 (HITEN): 105–15. https:/​/​doi.org/​10.4071/​HITEN-TA12.
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