Vol. 2013, Issue HITEN, 2013January 01, 2013 EDT
High Temperature 256Kbit (32Kbit × 8) HTEEPROM Reliability Testing
High Temperature 256Kbit (32Kbit × 8) HTEEPROM Reliability Testing
Joe G. Guimont, Bruce W. Ohme,
Guimont, Joe G., and Bruce W. Ohme. 2013. “High Temperature 256Kbit (32Kbit × 8) HTEEPROM Reliability Testing.” IMAPSource Proceedings 2013 (HITEN): 105–15. https://doi.org/10.4071/HITEN-TA12.