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High Temperature Conference Papers
Vol. 2013, Issue HITEN, 2013
January 01, 2013 EDT
High Temperature 256Kbit (32Kbit × 8) HTEEPROM Reliability Testing
Joe G. Guimont
,
Bruce W. Ohme
,
High-temperature electronics
EEPROM
Reliability
SOI CMOS
Non-volatile Memory
•
https://doi.org/10.4071/HITEN-TA12
IMAPSource Conference Papers
Guimont, Joe G., and Bruce W. Ohme. 2013. “High Temperature 256Kbit (32Kbit × 8) HTEEPROM Reliability Testing.”
IMAPSource Proceedings
2013 (HITEN): 105–15.
https://doi.org/10.4071/HITEN-TA12
.
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