Reliability of SiC Digital Telemetry Circuits on AlN Substrate

Reza Ghandi; Cheng-Po Chen; Liang Yin; Rich Saia; Tammy Johnson; Peter Sandvik; Kun Fang; R. Wayne Johnson

doi:10.4071/HITEN-WP16

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Ghandi, Reza, Cheng-Po Chen, Liang Yin, Rich Saia, Tammy Johnson, Peter Sandvik, Kun Fang, and R. Wayne Johnson. 2013. “Reliability of SiC Digital Telemetry Circuits on AlN Substrate.” IMAPSource Proceedings 2013 (HITEN): 302–8. https://doi.org/10.4071/HITEN-WP16.

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