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High Temperature Conference Papers
Vol. 2013, Issue HITEN, 2013January 01, 2013 EDT

Reliability of SiC Digital Telemetry Circuits on AlN Substrate

Reza Ghandi, Cheng-Po Chen, Liang Yin, Rich Saia, Tammy Johnson, Peter Sandvik, Kun Fang, R. Wayne Johnson,
Silicon CarbideDigital TelemetryGeothermalMOSFETs
https://doi.org/10.4071/HITEN-WP16
IMAPSource Conference Papers
Ghandi, Reza, Cheng-Po Chen, Liang Yin, Rich Saia, Tammy Johnson, Peter Sandvik, Kun Fang, and R. Wayne Johnson. 2013. “Reliability of SiC Digital Telemetry Circuits on AlN Substrate.” IMAPSource Proceedings 2013 (HITEN): 302–8. https:/​/​doi.org/​10.4071/​HITEN-WP16.
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