Vol. 2013, Issue HITEN, 2013January 01, 2013 EDT
Reliability of SiC Digital Telemetry Circuits on AlN Substrate
Reliability of SiC Digital Telemetry Circuits on AlN Substrate
Reza Ghandi, Cheng-Po Chen, Liang Yin, Rich Saia, Tammy Johnson, Peter Sandvik, Kun Fang, R. Wayne Johnson,
Ghandi, Reza, Cheng-Po Chen, Liang Yin, Rich Saia, Tammy Johnson, Peter Sandvik, Kun Fang, and R. Wayne Johnson. 2013. “Reliability of SiC Digital Telemetry Circuits on AlN Substrate.” IMAPSource Proceedings 2013 (HITEN): 302–8. https://doi.org/10.4071/HITEN-WP16.