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High Temperature Conference Papers
Vol. 2013, Issue HITEN, 2013January 01, 2013 EDT

Evaluation of Refractory Metals for Package Level Interconnection in a Harsh Environment

Riko I Made, Eric Jian Rong Phua, Key Wen Tan, Wei Chuan Ong, Clare Guanqi Huang, Hock Guan Ong, Vivek Chidambaram Nachiappan, Chee Cheong Wong, Chen Zhong, Chee Lip Gan,
interconnectionhigh temperaturehigh pressureelectricalresistanceadhesion
https://doi.org/10.4071/HITEN-WA11
IMAPSource Conference Papers
Made, Riko I, Eric Jian Rong Phua, Key Wen Tan, Wei Chuan Ong, Clare Guanqi Huang, Hock Guan Ong, Vivek Chidambaram Nachiappan, Chee Cheong Wong, Chen Zhong, and Chee Lip Gan. 2013. “Evaluation of Refractory Metals for Package Level Interconnection in a Harsh Environment.” IMAPSource Proceedings 2013 (HITEN): 207–12. https:/​/​doi.org/​10.4071/​HITEN-WA11.
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