Vol. 2013, Issue HITEN, 2013January 01, 2013 EDT
Experimental Investigation of Electro-thermal Stress Impact on SiC-BJTs Electrical Characteristics
Experimental Investigation of Electro-thermal Stress Impact on SiC-BJTs Electrical Characteristics
Thibaut Chailloux, Cyril Calvez, Pascal Bevilacqua, Dominique Planson, Dominique Tournier,
Chailloux, Thibaut, Cyril Calvez, Pascal Bevilacqua, Dominique Planson, and Dominique Tournier. 2013. “Experimental Investigation of Electro-Thermal Stress Impact on SiC-BJTs Electrical Characteristics.” IMAPSource Proceedings 2013 (HITEN): 290–97. https://doi.org/10.4071/HITEN-WP14.