Vol. 2013, Issue HITEN, 2013January 01, 2013 EDT
Reliability of Au-Ti for High Temperature Termination on Ferrite LTCC Inductors
Reliability of Au-Ti for High Temperature Termination on Ferrite LTCC Inductors
James Galipeau, Matt Gerlach,
Galipeau, James, and Matt Gerlach. 2013. “Reliability of Au-Ti for High Temperature Termination on Ferrite LTCC Inductors.” IMAPSource Proceedings 2013 (HITEN): 39–45. https://doi.org/10.4071/HITEN-MA16.