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ISSN 2380-4505
High Temperature Conference Papers
Vol. 2018, Issue HiTEC, 2018May 01, 2018 EDT

Performance Test Results of a Precision Data Acquisition and Control Platform for 200°C+ High Temperature Environments

Jeff Watson, Maithil Pachchigar, Ross Bannatyne, Clay Merritt, Christopher Conrad, Glenn Smollinger, Earle Drack,
high temperature electronicsdata acquisitionsignal processingmicrocontroller200°C+ operation
https://doi.org/10.4071/2380-4491-2018-HiTEN-000103
IMAPSource Conference Papers
Watson, Jeff, Maithil Pachchigar, Ross Bannatyne, Clay Merritt, Christopher Conrad, Glenn Smollinger, and Earle Drack. 2018. “Performance Test Results of a Precision Data Acquisition and Control Platform for 200°C+ High Temperature Environments.” IMAPSource Proceedings 2018 (HiTEC): 103–11. https:/​/​doi.org/​10.4071/​2380-4491-2018-HiTEN-000103.

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