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High Temperature Conference Papers
Vol. 2018, Issue HiTEC, 2018May 01, 2018 EDT

A 300°C High Reliability HALT/HAST Screening/Sorting Procedure for Ceramic Capacitors

Harold L. Snyder,
Ceramic CapacitorMLCCHigh Reliability Sorting ProcedureSPICE Model
https://doi.org/10.4071/2380-4491-2018-HiTEN-000129
IMAPSource Conference Papers
Snyder, Harold L. 2018. “A 300°C High Reliability HALT/HAST Screening/Sorting Procedure for Ceramic Capacitors.” IMAPSource Proceedings 2018 (HiTEC): 129–37. https:/​/​doi.org/​10.4071/​2380-4491-2018-HiTEN-000129.
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