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High Temperature Conference Papers
Vol. 2018, Issue HiTEC, 2018May 01, 2018 EDT

Robust Reliability of Ceramic Capacitors for Power Electronics

Abhijit Gurav, John Bultitude, John McConnell, Reggie Phillips,
High temperature capacitorCeramic CapacitorBME MLCCC0GX9Gtransient liquid phase sinteringTLPS
https://doi.org/10.4071/2380-4491-2018-HiTEN-000138
IMAPSource Conference Papers
Gurav, Abhijit, John Bultitude, John McConnell, and Reggie Phillips. 2018. “Robust Reliability of Ceramic Capacitors for Power Electronics.” IMAPSource Proceedings 2018 (HiTEC): 138–42. https:/​/​doi.org/​10.4071/​2380-4491-2018-HiTEN-000138.

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