Robust Reliability of Ceramic Capacitors for Power Electronics

Abhijit Gurav; John Bultitude; John McConnell; Reggie Phillips

doi:10.4071/2380-4491-2018-HiTEN-000138

Loading [Contrib]/a11y/accessibility-menu.js

Gurav, Abhijit, John Bultitude, John McConnell, and Reggie Phillips. 2018. “Robust Reliability of Ceramic Capacitors for Power Electronics.” IMAPSource Proceedings 2018 (HiTEC): 138–42. https://doi.org/10.4071/2380-4491-2018-HiTEN-000138.

View more stats