Co-optimized Reliability and Parasitic inductance in Small Footprint Vertical Silicon Carbide MOSFET

M. Montazeri; S. Seal; A. Wallace; A. Mantooth; D. Huitink

doi:10.4071/2380-4491-2018-HiTEN-000087

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Montazeri, M., S. Seal, A. Wallace, A. Mantooth, and D. Huitink. 2018. “Co-Optimized Reliability and Parasitic Inductance in Small Footprint Vertical Silicon Carbide MOSFET.” IMAPSource Proceedings 2018 (HiTEC): 87–92. https://doi.org/10.4071/2380-4491-2018-HiTEN-000087.

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