Vol. 2012, Issue HITEC, 2012January 01, 2012 EDT
High Temperature Analog-to-Digital Converter Reliability Testing
High Temperature Analog-to-Digital Converter Reliability Testing
Bruce W. Ohme, Mark R. Larson,
Ohme, Bruce W., and Mark R. Larson. 2012. “High Temperature Analog-to-Digital Converter Reliability Testing.” IMAPSource Proceedings 2012 (HITEC): 245–52. https://doi.org/10.4071/HITEC-WP17.