Vol. 2012, Issue HITEC, 2012January 01, 2012 EDT
Temperature Induced Voltage Offset Drifts in Silicon Carbide Pressure Sensors
Temperature Induced Voltage Offset Drifts in Silicon Carbide Pressure Sensors
Okojie, R.S., D. Lukco, V. Nguyen, and E. Savrun. 2012. “Temperature Induced Voltage Offset Drifts in Silicon Carbide Pressure Sensors.” IMAPSource Proceedings 2012 (HITEC): 99–103. https://doi.org/10.4071/HITEC-2012-TP16.
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