Loading [Contrib]/a11y/accessibility-menu.js
IMAPSource Conference Papers
Menu
Articles
Ceramics Conference Papers
Device Packaging Conference Presentations
General
High Temperature Conference Papers
IMAPS Chapter Conferences
Symposium Proceedings
All
For Authors
Editorial Board
About
Issues
Journal Micro & Elect Pkg
search
Sorry, something went wrong. Please try your search again.
×
Articles
Blog posts
RSS Feed
Enter the URL below into your favorite RSS reader.
https://imapsource.org/feed
×
High Temperature Conference Papers
Vol. 2012, Issue HITEC, 2012
January 01, 2012 EDT
Temperature Induced Voltage Offset Drifts in Silicon Carbide Pressure Sensors
R.S. Okojie
,
D. Lukco
,
V. Nguyen
,
E. Savrun
,
Silicon carbide
high temperature
pressure sensor
offset voltage drift
stability
•
https://doi.org/10.4071/HITEC-2012-TP16
IMAPSource Conference Papers
Okojie, R.S., D. Lukco, V. Nguyen, and E. Savrun. 2012. “Temperature Induced Voltage Offset Drifts in Silicon Carbide Pressure Sensors.”
IMAPSource Proceedings
2012 (HITEC): 99–103.
https://doi.org/10.4071/HITEC-2012-TP16
.
Save article as...
▾
PDF
XML
Citation (BibTeX)
View more stats