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Device Packaging Conference Presentations
Vol. 2012, Issue DPC, 2012January 01, 2012 EDT

Thermal Cycling Analysis of BGA Solder Joint Reliability

Betty H. Yeung, Torsten Hauck, Brett Wilkerson, Thomas Koschmieder,
flip chip thermal cycling solder joint reliability
• https://doi.org/10.4071/2012DPC-ta21
IMAPSource Conference Papers
Yeung, Betty H., Torsten Hauck, Brett Wilkerson, and Thomas Koschmieder. 2012. “Thermal Cycling Analysis of BGA Solder Joint Reliability.” IMAPSource Proceedings 2012 (DPC): 542–53. https://doi.org/10.4071/2012DPC-ta21.
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