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Device Packaging Conference Presentations
Vol. 2012, Issue DPC, 2012
January 01, 2012 EDT
Thermal Cycling Analysis of BGA Solder Joint Reliability
Betty H. Yeung
,
Torsten Hauck
,
Brett Wilkerson
,
Thomas Koschmieder
,
flip chip
thermal cycling
solder joint reliability
•
https://doi.org/10.4071/2012DPC-ta21
IMAPSource Conference Papers
Yeung, Betty H., Torsten Hauck, Brett Wilkerson, and Thomas Koschmieder. 2012. “Thermal Cycling Analysis of BGA Solder Joint Reliability.”
IMAPSource Proceedings
2012 (DPC): 542–53.
https://doi.org/10.4071/2012DPC-ta21
.
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