Vol. 2012, Issue DPC, 2012January 01, 2012 EDT
Simulating Atomic-Scale Defects with Atomic Methods and Extended Finite Elements
Simulating Atomic-Scale Defects with Atomic Methods and Extended Finite Elements
Jay Oswald,
Oswald, Jay. 2012. “Simulating Atomic-Scale Defects with Atomic Methods and Extended Finite Elements.” IMAPSource Proceedings 2012 (DPC): 1983–2005. https://doi.org/10.4071/2012DPC-wp34.