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Device Packaging Conference Presentations
Vol. 2012, Issue DPC, 2012January 01, 2012 EDT

Study of Factors Which Influenced to Bump Shape and Voids in Bumps during Bump Formation with Solder Paste

Masayuki Ishikawa, Hironori Uno, Takashi Yamaji, Ryuji Uesugi, Akihiro Masuda, Shingo Hirano, Fuyumi Mawatari, Natsuko Tanaka, Kohki Okada,
solder pastebumpreliability
https://doi.org/10.4071/2012DPC-tha21
IMAPSource Conference Papers
Ishikawa, Masayuki, Hironori Uno, Takashi Yamaji, Ryuji Uesugi, Akihiro Masuda, Shingo Hirano, Fuyumi Mawatari, Natsuko Tanaka, and Kohki Okada. 2012. “Study of Factors Which Influenced to Bump Shape and Voids in Bumps during Bump Formation with Solder Paste.” IMAPSource Proceedings 2012 (DPC): 2316–39. https:/​/​doi.org/​10.4071/​2012DPC-tha21.
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