Assessment of thick-film resistors for manufacturing piezoresistive sensors

Thomas Maeder; Caroline Jacq; Peter Ryser

doi:10.4071/CICMT-WP12

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Maeder, Thomas, Caroline Jacq, and Peter Ryser. 2015. “Assessment of Thick-Film Resistors for Manufacturing Piezoresistive Sensors.” IMAPSource Proceedings 2015 (CICMT): 213–23. https://doi.org/10.4071/CICMT-WP12.

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