Bend testing of micro-scale bulk metal specimens using a chip-scale test instrument

Li-Anne Liew; David T. Read; Nicholas Barbosa

doi:10.4071/2015DPC-tp36

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Liew, Li-Anne, David T. Read, and Nicholas Barbosa. 2015. “Bend Testing of Micro-Scale Bulk Metal Specimens Using a Chip-Scale Test Instrument.” IMAPSource Proceedings 2015 (DPC): 827–64. https://doi.org/10.4071/2015DPC-tp36.

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