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High Temperature Conference Papers
Vol. 2015, Issue HiTEN, 2015July 01, 2015 EDT

Gate Stack Engineering for High Temperature Silicon Carbide CMOS ICs

M.H. Weng, A.D. Murphy, D.T. Clark, D.A. Smith, R.F. Thompson, R.A.R. Young, E.P. Ramsay, H.K. Chan, A.B. Horsfall,
SiC Density of interface traps MOS Capacitors High-temperature
• https://doi.org/10.4071/HiTEN-Session1-Paper1_6
IMAPSource Conference Papers
Weng, M.H., A.D. Murphy, D.T. Clark, D.A. Smith, R.F. Thompson, R.A.R. Young, E.P. Ramsay, H.K. Chan, and A.B. Horsfall. 2015. “Gate Stack Engineering for High Temperature Silicon Carbide CMOS ICs.” IMAPSource Proceedings 2015 (HiTEN): 33–36. https://doi.org/10.4071/HiTEN-Session1-Paper1_6.
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