Experimental reliability studies and SPICE simulation for EEPROM at temperatures up to 450 °C

A. Kelberer; S. Dreiner; K. Grella; D. Dittrich; H. Kappert; H. Vogt; U. Paschen

doi:10.4071/HiTEN-Session1-Paper1_2

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Kelberer, A., S. Dreiner, K. Grella, D. Dittrich, H. Kappert, H. Vogt, and U. Paschen. 2015. “Experimental Reliability Studies and SPICE Simulation for EEPROM at Temperatures up to 450 °C.” IMAPSource Proceedings 2015 (HiTEN): 5–9. https://doi.org/10.4071/HiTEN-Session1-Paper1_2.

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