Vol. 2015, Issue HiTEN, 2015July 01, 2015 EDT
Experimental reliability studies and SPICE simulation for EEPROM at temperatures up to 450 °C
Experimental reliability studies and SPICE simulation for EEPROM at temperatures up to 450 °C
A. Kelberer, S. Dreiner, K. Grella, D. Dittrich, H. Kappert, H. Vogt, U. Paschen,
Kelberer, A., S. Dreiner, K. Grella, D. Dittrich, H. Kappert, H. Vogt, and U. Paschen. 2015. “Experimental Reliability Studies and SPICE Simulation for EEPROM at Temperatures up to 450 °C.” IMAPSource Proceedings 2015 (HiTEN): 5–9. https://doi.org/10.4071/HiTEN-Session1-Paper1_2.