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Ceramics Conference Papers
Vol. 2011, Issue CICMT, 2011September 01, 2011 EDT

X-Ray Inspection of LTCC Devices

Krzysztof Zaraska, Janina Gaudyn, Adam Bieńkowski, Marek Dohnalik, Andrzej Czerwiński, Mariusz Płuska, Monika Machnik,
LTCCX-raycomputed tomographyinspectionreliability
https://doi.org/10.4071/CICMT-2011-WP13
IMAPSource Conference Papers
Zaraska, Krzysztof, Janina Gaudyn, Adam Bieńkowski, Marek Dohnalik, Andrzej Czerwiński, Mariusz Płuska, and Monika Machnik. 2011. “X-Ray Inspection of LTCC Devices.” IMAPSource Proceedings 2011 (CICMT): 215–23. https:/​/​doi.org/​10.4071/​CICMT-2011-WP13.

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