Vol. 2011, Issue HITEN, 2011January 01, 2011 EDT
Reliability Testing on a Multilayer Chip Inductor Fabricated From a Ferrite With a 350 °C Curie Point
Reliability Testing on a Multilayer Chip Inductor Fabricated From a Ferrite With a 350 °C Curie Point
James Galipeau, George Slama,
Galipeau, James, and George Slama. 2011. “Reliability Testing on a Multilayer Chip Inductor Fabricated From a Ferrite With a 350 °C Curie Point.” IMAPSource Proceedings 2011 (HITEN): 14–20. https://doi.org/10.4071/HITEN-Paper3-JGalipeau.