Vol. 2011, Issue HITEN, 2011January 01, 2011 EDT
High Temperature Reliability Investigations of EEPROM Memory Cells Realised in Silicon-on-Insulator (SOI) Technology
High Temperature Reliability Investigations of EEPROM Memory Cells Realised in Silicon-on-Insulator (SOI) Technology
Grella, K., H. Vogt, and U. Paschen. 2011. “High Temperature Reliability Investigations of EEPROM Memory Cells Realised in Silicon-on-Insulator (SOI) Technology.” IMAPSource Proceedings 2011 (HITEN): 221–25. https://doi.org/10.4071/HITEN-Paper2-KGrella.
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