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High Temperature Conference Papers
Vol. 2011, Issue HITEN, 2011
January 01, 2011 EDT
285°C Resistor Drift and Failure Analysis
Milton Watts
,
Ron Smith
,
High Temperature Electronics
Resistors
Aging
Drift
HALT Testing
•
https://doi.org/10.4071/HITEN-Paper2-MWatts
IMAPSource Conference Papers
Watts, Milton, and Ron Smith. 2011. “285°C Resistor Drift and Failure Analysis.”
IMAPSource Proceedings
2011 (HITEN): 7–13.
https://doi.org/10.4071/HITEN-Paper2-MWatts
.
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