Vol. 2017, Issue DPC, 2017January 01, 2017 EDT
Development of high-yield and high-reliability design for high-performance ultra large scale 3DLSI processor
Development of high-yield and high-reliability design for high-performance ultra large scale 3DLSI processor
Hideki Kitada,
Kitada, Hideki. 2017. “Development of High-Yield and High-Reliability Design for High-Performance Ultra Large Scale 3DLSI Processor.” IMAPSource Proceedings 2017 (DPC): 1–31. https://doi.org/10.4071/2017DPC-TA1_Presentation2.