This website uses cookies

We use cookies to enhance your experience and support COUNTER Metrics for transparent reporting of readership statistics. Cookie data is not sold to third parties or used for marketing purposes.

Skip to main content
null
IMAPSource Conference Papers
  • Menu
  • Articles
    • Ceramics Conference Papers
    • Device Packaging Conference Presentations
    • EMPC Conference Proceedings (IMAPS Europe)
    • General
    • High Temperature Conference Papers
    • IMAPS Chapter Conferences
    • Symposium Proceedings
    • All
  • For Authors
  • Editorial Board
  • About
  • Issues
  • Journal Micro & Elect Pkg
  • search
  • LinkedIn (opens in a new tab)
  • RSS feed (opens a modal with a link to feed)

RSS Feed

Enter the URL below into your favorite RSS reader.

http://localhost:16757/feed
ISSN 2380-4505
Device Packaging Conference Presentations
Vol. 2017, Issue DPC, 2017January 01, 2017 EDT

Wafer Thinning for Advanced Packaging Applications

Laura Mauer, John Taddei, Scott Kroeger,
Wafer ThininngFOWLPWet Etch
https://doi.org/10.4071/2017DPC-WP2_Presentation1
IMAPSource Conference Papers
Mauer, Laura, John Taddei, and Scott Kroeger. 2017. “Wafer Thinning for Advanced Packaging Applications.” IMAPSource Proceedings 2017 (DPC): 1–26. https:/​/​doi.org/​10.4071/​2017DPC-WP2_Presentation1.

View more stats

Powered by Scholastica, the modern academic journal management system