Minimizing Film Stress and Degradation in Thin-Film Niobium Superconducting Cables

Vaibhav Gupta; John A. Sellers; Charles D. Ellis; Bhargav Yelamanchili; Simin Zou; Yang Cao; David B. Tuckerman; Michael C. Hamilton

doi:10.4071/2017DPC-THA3_Presentation4

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Gupta, Vaibhav, John A. Sellers, Charles D. Ellis, Bhargav Yelamanchili, Simin Zou, Yang Cao, David B. Tuckerman, and Michael C. Hamilton. 2017. “Minimizing Film Stress and Degradation in Thin-Film Niobium Superconducting Cables.” IMAPSource Proceedings 2017 (DPC): 1–25. https://doi.org/10.4071/2017DPC-THA3_Presentation4.

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