Vol. 2017, Issue DPC, 2017January 01, 2017 EDT
Minimizing Film Stress and Degradation in Thin-Film Niobium Superconducting Cables
Minimizing Film Stress and Degradation in Thin-Film Niobium Superconducting Cables
Vaibhav Gupta, John A. Sellers, Charles D. Ellis, Bhargav Yelamanchili, Simin Zou, Yang Cao, David B. Tuckerman, Michael C. Hamilton,
Gupta, Vaibhav, John A. Sellers, Charles D. Ellis, Bhargav Yelamanchili, Simin Zou, Yang Cao, David B. Tuckerman, and Michael C. Hamilton. 2017. “Minimizing Film Stress and Degradation in Thin-Film Niobium Superconducting Cables.” IMAPSource Proceedings 2017 (DPC): 1–25. https://doi.org/10.4071/2017DPC-THA3_Presentation4.