Vol. 2017, Issue HiTEN, 2017July 01, 2017 EDT
High Temperature EEPROM Using a Differential Approach for High Reliability
High Temperature EEPROM Using a Differential Approach for High Reliability
Holger Kappert, Sebastian Braun, Michael Alfring, Norbert Kordas, Andreas Kelberer, Stefan Dreiner, Rainer Kokozinski,
Kappert, Holger, Sebastian Braun, Michael Alfring, Norbert Kordas, Andreas Kelberer, Stefan Dreiner, and Rainer Kokozinski. 2017. “High Temperature EEPROM Using a Differential Approach for High Reliability.” IMAPSource Proceedings 2017 (HiTEN): 42–45. https://doi.org/10.4071/2380-4491.2017.HiTEN.42.
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