Vol. 2017, Issue HiTEN, 2017July 01, 2017 EDT
Comparison of a Current Mode Reference Generator vs.a ΔVBE Bandgap Circuit in a 1.0μm Partially-Depleted Silicon-On-Insulator CMOS Process for High Temperature (220 °C) Environments
Comparison of a Current Mode Reference Generator vs.a ΔVBE Bandgap Circuit in a 1.0μm Partially-Depleted Silicon-On-Insulator CMOS Process for High Temperature (220 °C) Environments
Alex Pike, Adrien Corne, Frank Bohac, Ravi Ananth,
Pike, Alex, Adrien Corne, Frank Bohac, and Ravi Ananth. 2017. “Comparison of a Current Mode Reference Generator vs.a ΔVBE Bandgap Circuit in a 1.0μm Partially-Depleted Silicon-On-Insulator CMOS Process for High Temperature (220 °C) Environments.” IMAPSource Proceedings 2017 (HiTEN): 234–37. https://doi.org/10.4071/2380-4491.2017.HiTEN.234.