Vol. 2017, Issue HiTEN, 2017July 01, 2017 EDT
Microstructure stability of TLPS interconnects in high operating temperature applications
Microstructure stability of TLPS interconnects in high operating temperature applications
Catherine Shearer,
Shearer, Catherine. 2017. “Microstructure Stability of TLPS Interconnects in High Operating Temperature Applications.” IMAPSource Proceedings 2017 (HiTEN): 226–33. https://doi.org/10.4071/2380-4491.2017.HiTEN.226.