Microstructure stability of TLPS interconnects in high operating temperature applications

Catherine Shearer

doi:10.4071/2380-4491.2017.HiTEN.226

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Shearer, Catherine. 2017. “Microstructure Stability of TLPS Interconnects in High Operating Temperature Applications.” IMAPSource Proceedings 2017 (HiTEN): 226–33. https://doi.org/10.4071/2380-4491.2017.HiTEN.226.

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