Kato, Fumiki, Hiroki Takahashi, Hidekazu Tanisawa, Kenichi Koui, Shinji Sato, Yoshinori Murakami, Hiroshi Nakagawa, Hiroshi Yamaguchi, and Hiroshi Sato. 2017. “Evaluation of Thermal Resistance Degradation of SiC Power Module Corresponding to Thermal Cycle Test.”
IMAPSource Proceedings 2017 (HiTEN): 1–5.
https://doi.org/10.4071/2380-4491.2017.HiTEN.223.