Vol. 2017, Issue HiTEN, 2017July 01, 2017 EDT
Evaluation of Thermal Resistance Degradation of SiC Power Module Corresponding to Thermal Cycle Test
Evaluation of Thermal Resistance Degradation of SiC Power Module Corresponding to Thermal Cycle Test
Fumiki Kato, Hiroki Takahashi, Hidekazu Tanisawa, Kenichi Koui, Shinji Sato, Yoshinori Murakami, Hiroshi Nakagawa, Hiroshi Yamaguchi, Hiroshi Sato,
Kato, Fumiki, Hiroki Takahashi, Hidekazu Tanisawa, Kenichi Koui, Shinji Sato, Yoshinori Murakami, Hiroshi Nakagawa, Hiroshi Yamaguchi, and Hiroshi Sato. 2017. “Evaluation of Thermal Resistance Degradation of SiC Power Module Corresponding to Thermal Cycle Test.” IMAPSource Proceedings 2017 (HiTEN): 1–5. https://doi.org/10.4071/2380-4491.2017.HiTEN.223.
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