Vol. 2016, Issue 1, 2016October 01, 2016 EDT
Computer-Aided Predictive Reliability Risk Analysis for High-Temperature Operation of Subsurface Electronics Development
Computer-Aided Predictive Reliability Risk Analysis for High-Temperature Operation of Subsurface Electronics Development
Liew, Josh, and Otto Fanini. 2016. “Computer-Aided Predictive Reliability Risk Analysis for High-Temperature Operation of Subsurface Electronics Development.” IMAPSource Proceedings 2016 (1): 351–57. https://doi.org/10.4071/isom-2016-WP51.
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