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Symposium Proceedings
Vol. 2016, Issue 1, 2016
October 01, 2016 EDT
Computer-Aided Predictive Reliability Risk Analysis for High-Temperature Operation of Subsurface Electronics Development
Josh Liew
,
Otto Fanini
,
Design for Reliability
DfR
Computer Aided Design
CAD
Mean Time between Failure
MTBF
design cycle
thermal stress
vibration stress
service life prediction
time-to-market
•
https://doi.org/10.4071/isom-2016-WP51
IMAPSource Conference Papers
Liew, Josh, and Otto Fanini. 2016. “Computer-Aided Predictive Reliability Risk Analysis for High-Temperature Operation of Subsurface Electronics Development.”
IMAPSource Proceedings
2016 (1): 351–57.
https://doi.org/10.4071/isom-2016-WP51
.
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