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Symposium Proceedings
Vol. 2011, Issue 1, 2011
January 01, 2011 EDT
High-quality multiple global layers on chip-redistributed wafer for wafer-level system integration using pseudo-SOC
Atsuko IIDA
,
Yutaka ONOZUKA
,
Hiroshi YAMADA
,
Toshihiko NAGANO
,
Kazuhiko ITAYA
,
Wafer-level system integration
Pseudo-SOC
Chip-redistributed wafer
Multiple global layers
One-chip module
FEM stress analysis
•
https://doi.org/10.4071/isom-2011-WP5-Paper3
IMAPSource Conference Papers
IIDA, Atsuko, Yutaka ONOZUKA, Hiroshi YAMADA, Toshihiko NAGANO, and Kazuhiko ITAYA. 2011. “High-Quality Multiple Global Layers on Chip-Redistributed Wafer for Wafer-Level System Integration Using Pseudo-SOC.”
IMAPSource Proceedings
2011 (1): 820–27.
https://doi.org/10.4071/isom-2011-WP5-Paper3
.
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