Vol. 2012, Issue 1, 2012January 01, 2012 EDT
RF/Microwave Die Attach of Gallium Nitride Devices Achieving Less Than 1% Voiding in a Flux-Free Environment
RF/Microwave Die Attach of Gallium Nitride Devices Achieving Less Than 1% Voiding in a Flux-Free Environment
Zappella, Pierino I, Paul W Barnes, David Muhs, and Bruce Wilson. 2012. “RF/Microwave Die Attach of Gallium Nitride Devices Achieving Less Than 1% Voiding in a Flux-Free Environment.” IMAPSource Proceedings 2012 (1): 573–80. https://doi.org/10.4071/isom-2012-WA21.