Vol. 2014, Issue 1, 2014January 01, 2014 EDT
Influence of Fabrication Process Parameters and Material Properties on Process Yield Performance on RF and Microwave Thin Film based Termination Resistors
Influence of Fabrication Process Parameters and Material Properties on Process Yield Performance on RF and Microwave Thin Film based Termination Resistors
Rahman, Akhlaq, Fred Olinger, and Michael Howieson. 2014. “Influence of Fabrication Process Parameters and Material Properties on Process Yield Performance on RF and Microwave Thin Film Based Termination Resistors.” IMAPSource Proceedings 2014 (1): 832–37. https://doi.org/10.4071/isom-THP25.