Vol. 2015, Issue 1, 2015October 01, 2015 EDT
Technique to predict reliability failure in side-gate transfer molded packages
Technique to predict reliability failure in side-gate transfer molded packages
Lakhera, Nishant, Tom Battle, Sheila Chopin, Sandeep Shantaram, and Akhilesh K. Singh. 2015. “Technique to Predict Reliability Failure in Side-Gate Transfer Molded Packages.” IMAPSource Proceedings 2015 (1): 696–701. https://doi.org/10.4071/isom-2015-THA61.