Vol. 2010, Issue 1, 2010January 01, 2010 EDT
Investigation on the failure criterion of reliability testing for Pb-free BGA packages
Investigation on the failure criterion of reliability testing for Pb-free BGA packages
Xie, Weidong, Tae-Kyu Lee, Kuo-Chuan Liu, and Jie Xue. 2010. “Investigation on the Failure Criterion of Reliability Testing for Pb-Free BGA Packages.” IMAPSource Proceedings 2010 (1): 105–9. https://doi.org/10.4071/isom-2010-TA4-Paper1.