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Symposium Proceedings
Vol. 2010, Issue 1, 2010
January 01, 2010 EDT
Investigation on the failure criterion of reliability testing for Pb-free BGA packages
Weidong Xie
,
Tae-Kyu Lee
,
Kuo-Chuan Liu
,
Jie Xue
,
failure criterion
reliability testing
Pb-free
BGA packages
daisy-chained
•
https://doi.org/10.4071/isom-2010-TA4-Paper1
IMAPSource Conference Papers
Xie, Weidong, Tae-Kyu Lee, Kuo-Chuan Liu, and Jie Xue. 2010. “Investigation on the Failure Criterion of Reliability Testing for Pb-Free BGA Packages.”
IMAPSource Proceedings
2010 (1): 105–9.
https://doi.org/10.4071/isom-2010-TA4-Paper1
.
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