Vol. 2014, Issue 1, 2014January 01, 2014 EDT
The Importance of Effective Root Cause Analysis of Failures in High Reliability Microelectronics Applications: A Case Study
The Importance of Effective Root Cause Analysis of Failures in High Reliability Microelectronics Applications: A Case Study
Schulz, Gwen. 2014. “The Importance of Effective Root Cause Analysis of Failures in High Reliability Microelectronics Applications: A Case Study.” IMAPSource Proceedings 2014 (1): 493–99. https://doi.org/10.4071/isom-WA45.