Vol. 2013, Issue 1, 2013January 01, 2013 EDT
Dicing Development for low-k Copper Wafers using Nickel-Palladium-Gold Bond Pads for Automotive Application
Dicing Development for low-k Copper Wafers using Nickel-Palladium-Gold Bond Pads for Automotive Application
Tran, Tu Anh, Varughese Mathew, Wen Shi Koh, K. Y. Yow, and Y. K. Au. 2013. “Dicing Development for Low-k Copper Wafers Using Nickel-Palladium-Gold Bond Pads for Automotive Application.” IMAPSource Proceedings 2013 (1): 657–62. https://doi.org/10.4071/isom-2013-WP24.