Vol. 2012, Issue 1, 2012January 01, 2012 EDT
Electromigration Reliability of Glass Ceramic Multilayer Substrate with Various Surface Finishes
Electromigration Reliability of Glass Ceramic Multilayer Substrate with Various Surface Finishes
Matsumoto, Hiroshi, Akira Wakazaki, Shingo Sato, Takashi Okunosono, and Chihiro Makihara. 2012. “Electromigration Reliability of Glass Ceramic Multilayer Substrate with Various Surface Finishes.” IMAPSource Proceedings 2012 (1): 503–9. https://doi.org/10.4071/isom-2012-TP67.