Vol. 2015, Issue 1, 2015October 01, 2015 EDT
Reliability of Manganese Dioxide and Conductive Polymer Tantalum Capacitors under Temperature Humidity Bias Testing
Reliability of Manganese Dioxide and Conductive Polymer Tantalum Capacitors under Temperature Humidity Bias Testing
Peter, Anto, Michael H. Azarian, and Michael Pecht. 2015. “Reliability of Manganese Dioxide and Conductive Polymer Tantalum Capacitors under Temperature Humidity Bias Testing.” IMAPSource Proceedings 2015 (1): 713–19. https://doi.org/10.4071/isom-2015-THA64.