Vol. 2020, Issue 1, 2020September 01, 2020 EDT
Optimizing X-Ray Inspection for Advanced Packaging Applications
Optimizing X-Ray Inspection for Advanced Packaging Applications
Peterson, Brennan, Michael Kwan, Fred Duewer, Andrew Reid, and Rhiannon Brooks. 2020. “Optimizing X-Ray Inspection for Advanced Packaging Applications.” IMAPSource Proceedings 2020 (1): 165–68. https://doi.org/10.4071/2380-4505-2020.1.000165.