Vol. 2010, Issue 1, 2010January 01, 2010 EDT
Drop Test Simulation for the Component-Level Reliability of Module Packages
Drop Test Simulation for the Component-Level Reliability of Module Packages
Gu, Yu, and Daniel Jin. 2010. “Drop Test Simulation for the Component-Level Reliability of Module Packages.” IMAPSource Proceedings 2010 (1): 220–26. https://doi.org/10.4071/isom-2010-TP2-Paper4.