ISSN 2380-4505
Vol. 2016, Issue 1, 2016October 01, 2016 EDT
3D SiP Assembly and Reliability for Glass Substrate with Through Vias
3D SiP Assembly and Reliability for Glass Substrate with Through Vias
Tain, Ra-Min, Dyi-Chung Hu, Kai-Ming Yang, Yu-Hua Chen, Jui-Tang Chen, De-Shiang Liu, and Chen-Hao Lin. 2016. “3D SiP Assembly and Reliability for Glass Substrate with Through Vias.” IMAPSource Proceedings 2016 (1): 282–87. https://doi.org/10.4071/isom-2016-WP22.
