Vol. 2016, Issue 1, 2016October 01, 2016 EDT
3D SiP Assembly and Reliability for Glass Substrate with Through Vias
3D SiP Assembly and Reliability for Glass Substrate with Through Vias
Tain, Ra-Min, Dyi-Chung Hu, Kai-Ming Yang, Yu-Hua Chen, Jui-Tang Chen, De-Shiang Liu, and Chen-Hao Lin. 2016. “3D SiP Assembly and Reliability for Glass Substrate with Through Vias.” IMAPSource Proceedings 2016 (1): 282–87. https://doi.org/10.4071/isom-2016-WP22.