Vol. 2010, Issue 1, 2010January 01, 2010 EDT
Wire Bonding UPH and Stitch Bond Improvement using 20 Micron Diameter Insulated Wire with Security Bump
Wire Bonding UPH and Stitch Bond Improvement using 20 Micron Diameter Insulated Wire with Security Bump
Nan, Chunyan, Michael Mayer, Y. Norman Zhou, Jairus L. Pisigan, John Persic, Young-Kyu Song, and Henry Bathan. 2010. “Wire Bonding UPH and Stitch Bond Improvement Using 20 Micron Diameter Insulated Wire with Security Bump.” IMAPSource Proceedings 2010 (1): 667–74. https://doi.org/10.4071/isom-2010-WP4-Paper4.