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Symposium Proceedings
Vol. 2010, Issue 1, 2010January 01, 2010 EDT

Investigation of Silver Migration Impacts on Microwave Systems Fabricated on LTCC Substrate Under High-Power RF Excitation and High Temperature and Humidity Conditions.

Deepukumar M. Nair, K. M. Nair, Ken Souders, Michael Smith, Mark McCombs, James Parisi, Tim Mobley, Bradley Thrasher,
LTCCSilver MigrationHigh Power RF TestingDuPont GreenTape™ 951
https://doi.org/10.4071/isom-2010-TP3-Paper1
IMAPSource Conference Papers
Nair, Deepukumar M., K. M. Nair, Ken Souders, Michael Smith, Mark McCombs, James Parisi, Tim Mobley, and Bradley Thrasher. 2010. “Investigation of Silver Migration Impacts on Microwave Systems Fabricated on LTCC Substrate Under High-Power RF Excitation and High Temperature and Humidity Conditions.” IMAPSource Proceedings 2010 (1): 242–47. https:/​/​doi.org/​10.4071/​isom-2010-TP3-Paper1.
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