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Symposium Proceedings
Vol. 2010, Issue 1, 2010January 01, 2010 EDT

Using In situ Capacitance Measurements to Monitor the Stability of Thermal Interface Materials in Complex PCB Assemblies

Michael Gaynes, Timothy Chainer, Edward Yarmchuk, John Torok, David Edwards, David Olson, Katie Pizzolato,
Thermal interface materialsheat spreadercapacitance
https://doi.org/10.4071/isom-2010-WA3-Paper4
IMAPSource Conference Papers
Gaynes, Michael, Timothy Chainer, Edward Yarmchuk, John Torok, David Edwards, David Olson, and Katie Pizzolato. 2010. “Using In Situ Capacitance Measurements to Monitor the Stability of Thermal Interface Materials in Complex PCB Assemblies.” IMAPSource Proceedings 2010 (1): 450–57. https:/​/​doi.org/​10.4071/​isom-2010-WA3-Paper4.
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