Pb-free v/s Tin-Lead Reliability Comparison for Telecom/High Reliability Applications

Ganesh Iyer; Gnyaneshwar Ramakrishna; Lavanya Gopalakrishnan; Kuo-Chuan Liu

doi:10.4071/isom-2010-TP4-Paper1

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Iyer, Ganesh, Gnyaneshwar Ramakrishna, Lavanya Gopalakrishnan, and Kuo-Chuan Liu. 2010. “Pb-Free v/s Tin-Lead Reliability Comparison for Telecom/High Reliability Applications.” IMAPSource Proceedings 2010 (1): 284–93. https://doi.org/10.4071/isom-2010-TP4-Paper1.

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