Vol. 2010, Issue 1, 2010January 01, 2010 EDT
Pb-free v/s Tin-Lead Reliability Comparison for Telecom/High Reliability Applications
Pb-free v/s Tin-Lead Reliability Comparison for Telecom/High Reliability Applications
Iyer, Ganesh, Gnyaneshwar Ramakrishna, Lavanya Gopalakrishnan, and Kuo-Chuan Liu. 2010. “Pb-Free v/s Tin-Lead Reliability Comparison for Telecom/High Reliability Applications.” IMAPSource Proceedings 2010 (1): 284–93. https://doi.org/10.4071/isom-2010-TP4-Paper1.