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Symposium Proceedings
Vol. 2010, Issue 1, 2010
January 01, 2010 EDT
Pb-free v/s Tin-Lead Reliability Comparison for Telecom/High Reliability Applications
Ganesh Iyer
,
Gnyaneshwar Ramakrishna
,
Lavanya Gopalakrishnan
,
Kuo-Chuan Liu
,
pb-free
tin-lead
time-zero reliability testing
telecom
high reliability applications
•
https://doi.org/10.4071/isom-2010-TP4-Paper1
IMAPSource Conference Papers
Iyer, Ganesh, Gnyaneshwar Ramakrishna, Lavanya Gopalakrishnan, and Kuo-Chuan Liu. 2010. “Pb-Free v/s Tin-Lead Reliability Comparison for Telecom/High Reliability Applications.”
IMAPSource Proceedings
2010 (1): 284–93.
https://doi.org/10.4071/isom-2010-TP4-Paper1
.
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