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Symposium Proceedings
Vol. 2017, Issue 1, 2017
October 01, 2017 EDT
Reduction of Thermal Stress - Part III: UBM and Passivation Thickness Optimization
Raj Sekar Sethu
,
Salil Hari Kulkarni
,
How Ung Ha
,
Kok Heng Soon
,
Chip Package Interaction
Finite Element Analysis
Bond Pad
Thermo-Mechanical Stress
•
https://doi.org/10.4071/isom-2017-THP14_016
IMAPSource Conference Papers
Sethu, Raj Sekar, Salil Hari Kulkarni, How Ung Ha, and Kok Heng Soon. 2017. “Reduction of Thermal Stress - Part III: UBM and Passivation Thickness Optimization.”
IMAPSource Proceedings
2017 (1): 694–98.
https://doi.org/10.4071/isom-2017-THP14_016
.
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