ISSN 2380-4505
Vol. 2019, Issue 1, 2019October 01, 2019 EDT
Early detection and instantaneous cause analysis of defects in interconnects by machine learning (ranking-CNN) of scattering parameter patterns
Early detection and instantaneous cause analysis of defects in interconnects by machine learning (ranking-CNN) of scattering parameter patterns
Kang, Tae Yeob, Donghwan Seo, Yongchan Park, Joonki Min, and Taek-Soo Kim. 2019. “Early Detection and Instantaneous Cause Analysis of Defects in Interconnects by Machine Learning (Ranking-CNN) of Scattering Parameter Patterns.” IMAPSource Proceedings 2019 (1): 289–94. https://doi.org/10.4071/2380-4505-2019.1.000289.