Vol. 2011, Issue 1, 2011January 01, 2011 EDT
High resolution analyzes of resistance behavior in eWLB metal contacts
High resolution analyzes of resistance behavior in eWLB metal contacts
Klengel (Bennemann), S., M. Krause, L. Berthold, M. Petzold, J. Förster, K. Pressel, and T. Meyer. 2011. “High Resolution Analyzes of Resistance Behavior in eWLB Metal Contacts.” IMAPSource Proceedings 2011 (1): 241–48. https://doi.org/10.4071/isom-2011-TP2-Paper3.